E H 测量分选设备

E+H 测量分选设备

E+H Measuring sorting system

E+H成立于1968年在德国卡尔斯鲁厄成立，1978年进入半导体行业，在1996年的半导体展会上，E+H是第一个展示12英寸测量设备的公司。
此设备可按客户要求定制测量：厚度，电阻率(须有厚度)，表面粗糙度，P/N型等及设置分选个数。测量机构均为无接触测量，设备接触工件部分均采用聚醚醚酮材质，支持匹配客户指定的硅片盒。测量数据稳定准确，操作简单。
E+H产品众多，功能各异，欢迎来电详询。

E+H OHG is founded in 1968.In 1978,E+H invented its first semiconductor applications.E+H was the first company showing a 300mm tool at the Semicon in 1996!
The equipment can be made according to customer requirements，like thinkness;resistivity(THK necessary);P/N;sorting and so on.The measuring parts are all non-contact, and the material of parts touching the workpiece are PEEK.Support for matching customer’s cassette.The measurement data is accurate, and the operation is very easy.
E+H has many products with different functions ,please contact us.